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  1. Angstrom Advanced Inc. - Ellipsometer

    Spectroscopic Ellipsometer, Spectroscopic Ellipsometry, Ellipsometer, Ellipsometry, thin film, coating, thickness measurements, thin film measurement, film ...
    coating2
    thin film1
    dre1
    thickness1
    SWE1
    sopra1
    refractive index1
    Ellipsometer1
    Ellipsometry1
    Spectroscopic1
    JOBIN YVON1
    Spectroscopic Ellipsometry1
    Spectroscopic Ellipsometer1
    thin film thickness1
    extinction coefficient1
    Beaglehole1
    n&k1
    Angstrom Sun0
    Gaetner0
    J.A.Woollam0
    jobinyvon0
    Woollam0

    www.angstromadvanced.com - 2009-02-04

  2. Thin Film Home Page - HORIBA

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometer.info - 2009-04-04

  3. Thin Film Home Page

    Thin Film metrology, ellipsometry and process control
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.ellipsometry.co.uk - 2009-02-08

  4. Process Control Products from HORIBA Jobin Yvon

    Process Applications of Thin Film
    instrumentation2
    real time2
    process control2
    metrology2
    rotating1
    thin film1
    in-situ1
    sofie1
    interferometry1
    thin films1
    insitu1
    compensator1
    ellipsometer1
    ellipsometry1
    optical properties1
    ellipsometers1
    birefringence1
    spectroscopic ellipsometry1
    optical constants1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    optical emission spectroscopy1
    multiwavelength ellipsometer1
    real-time process monitoring1
    thin film metrology1
    focused beam ellipsometry1
    infrared ellipsometer1
    infrared ellipsometry1
    retardance1
    phase modulated ellipsometer1

    www.jyprocesscontrol.com - 2009-02-07

  5. Scientific Computing International - Raising Thin Film Metrology to a New Level. SCI offers metrology systems for thin-film material characterization, with ...

    Scientific Computing International (SCI) provides high resolution thin film metrology tools and analysis software products to leading companies in the ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1
    thin film metrology tools0

    www.sci-soft.com - 2009-02-07

  6. Scientific Computing International - FilmTek Instruments

    FilmTek™ 2000SE - Spectroscopic Ellipsometer. Based on a rotating compensator design, the FilmTek™ 2000SE combines spectroscopic ellipsometry with normal inc ...
    index3
    SCI2
    metrology2
    thin film1
    thickness1
    spectrophotometer1
    film thickness1
    reflectometer1
    ellipsometer1
    roughness1
    spectrophotometry1
    ellipsometry1
    material analysis1
    optical properties1
    ellipsometers1
    spectroscopic ellipsometry1
    material characterization1
    reflectometry1
    index of refraction1
    spectroscopic ellipsometer1
    thin film thickness1
    film thickness measurement1
    multiwavelength ellipsometer1
    thin film metrology1
    reflectometers1
    extinction coefficient1
    crystallinity1
    metrology tools1
    multi angle reflectometer1
    spectroscopic reflectometer1
    spectroscopic reflectometry1

    www.sciinstruments.com - 2009-02-07

  7. Metricon Prism Coupler Instruments

    Metricon Corporation has pioneered the practical application of prism coupling technology to problems of thin film, bulk material, and optical waveguide ...
    index3
    Inc.3
    optical2
    polymers2
    waveguide1
    thin film1
    spr1
    refractive1
    biosensor1
    refractometer1
    plasmon1
    Abbe1
    film thickness1
    ellipsometer1
    ellipsometry1
    surface plasmon resonance1
    birefringence1
    thin film thickness1
    Metricon1
    Abbe refractometer1
    Sairon1
    prism coupler0
    prism coupling0
    Sairon technolgy0
    Sairon technology0
    VAMFO0
    waveguide loss0

    www.metricon.com - 2009-02-15

  8. Ellipsometers from HORIBA Jobin Yvon

    HORIBA Jobin Yvon ellipsometers combine two key elements: phase modulation and an entirely numerical data acquisition and processing system. It allows real-time ...
    film5
    delta2
    polymer2
    psi2
    kinetic1
    multilayer1
    thin film1
    kinetics1
    thickness1
    multi-layer1
    polarisation1
    refractive index1
    film thickness1
    thin-film1
    Ellipsometer1
    ellipsometry1
    spectroscopic1
    polarized light1
    single layer1
    multiple layers1
    thin film characterisation1
    liquid film1
    polarised light1
    langmuir blodgett1
    variable angle1
    liquid thin film1
    liquid thin-films1
    polymeric characterisation1
    thin-film characterisation1
    thin-film thickness1
    thin film tickness1

    www.ellipsometer.co.uk - 2009-02-08

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